Residual Stress Measurement of Industrial Polymers by X-Ray Diffraction

Abstract

In this study, residual stresses in polyamide (PA) materials were measured by the x-ray stress measurement technique. X-ray stress measurement is widely used to measure residual stresses, however, this measurement is not many used in polymeric materials. There are two problems for measuring residual stresses in polymer. Firstly, the diffraction peak from the polymer appears at the low 2θangle region. Thus the measurement accuracy for strains reduces. Secondly, the low 2θangle region is very difficult to use the sin2ψmethod. In this study,Ω-diffractometer with transmission method was used to resolve these problems. The measured data was plotted in thed-sin2ψdiagram, and it was coincident with the linear regression line clearly. X-ray elastic constant (XEC) of PA was estimated from these results.