Structure and Composition Study of InSb Films Prepared by Radio-Frequency Sputtering

Author:

Yao Yan Ping1,Liu Chun Ling1,Qi Hai Dong1,Chang Xi1,Wang Chun Wu1

Affiliation:

1. Jilin Normal University

Abstract

We present a systematic study of the effect of the sputtering parameters on the structure and composition of InSb film. The effect of the sputtering parameters on the crystallographic structure of InSb films is discussed in terms of the kinetic energy of the particle bombarding the growing film. Measurements of the chemical composition show that In to Sb concentration ratio increases with the increase of working pressure because Sb atoms are more rapidly thermalized by collisions with argon atoms during the transport process of the sputtered atoms. And the composition of the films is governed by the Sb re-evaporation process at the surface of the growing films. In to Sb concentration ratio is enhanced by increasing the substrate temperature (essentially) or RF power.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Effect of aluminum content on the structural, morphology, and electrical properties of Al1-x Sbx thin films;Journal of Physics: Conference Series;2019-07-01

2. Ion irradiation effects on Sb-rich GaSb films;Materials Research Express;2018-11-28

3. Ion irradiation-induced polycrystalline InSb foam;Journal of Physics D: Applied Physics;2017-11-06

4. Structural and electronic characterization of antimonide films made by magnetron sputtering;Journal of Physics D: Applied Physics;2017-01-25

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