Abstract
The copper phthalocyanine thin films were deposited on quartz and Si/SiO2 substrates at different substrate temperatures. The morphologies, structures and optical properties of CuPc films were characterized by scanning electron microscopy, X-ray diffra ction and UV-Visible spectroscopy. The polymorph of alpha–CuPc was observed in films deposited at temperature ranging from 20°C to 145°C. The transmission and absorption spectra of CuPc films deposited at different temperatures are presented.
Publisher
Trans Tech Publications, Ltd.