Affiliation:
1. Jiangnan University
2. China Academy of Ordnance Science
Abstract
In the chemical mechanical polishing process, the relationship of relative motion of polishing pad and polishing head plays very important role for CMP quality. This paper established the mathematical model in order to investigate the relative motion of polishing pad and polishing head. It was found that the speed ratio of polishing pad and polishing head shows great influence on the CMP uniformity. And when the value of speed ratio of relative rotation approaches 1.23, the distribution of abrasives’ trajectories is close and uniform. Theoretically, the surface quality of workpiece is better.
Publisher
Trans Tech Publications, Ltd.
Reference11 articles.
1. D.M. Guo, R.K. Kang, J.X. Su, et al. Journal of Mechanical Engineering Vol. 39(2003), p.100.
2. J.X. Su, D.M. Guo, R.K. Kang, et al. Mater Sci Forum Vol. 471~472(2004), p.26.
3. J.X. Su, D.M. Guo, R.K. Kang, et al. Chinese Journal of Semiconductors Vol. 26(2005), p.606.
4. A. Michael, Fury. Solid state technol ogy Vol. 38(1995), p.81.
5. B. L. Gehman. SolidState Technology Vol. 44(2001), p.128.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献