Effect of CW-CO2 Laser Evaporation Parameters on Structural and Physical Properties of ZnSe Film

Abstract

ZnSe thin films were deposited onto glass substrates by CW-CO2laser evaporation with the various evaporation times and laser power. SEM studies showed that the thicknesses of deposited films were varied from 176 nm to 1824 nm. AFM studies showed that the surface roughnesses were varied from 2.4 nm to 5.1 nm. The structure of deposited films were indicated by XRD technique which the result showed the cubic structure. The average crystallite sizes were calculated from the XRD pattern with ranged between 23.8 nm and 31.7 nm. The transmission spectates were ranged from 250 nm to 900 nm. The values of the optical bandgap energies determined from the absorption spectra were ranged between 2.61 eV and 2.88 eV. This paper presents the simple and low cost technique for ZnSe film deposition. Another advantage of this research is the high-precision control of thickness by the variation of the evaporation time and laser power.