On Faulting in Nanocrystallites of FCC Metals

Author:

Beyerlein Kenneth R.1,Leoni Matteo2,Snyder Robert L.3,Scardi Paolo2

Affiliation:

1. Università di Trento

2. Department of Materials Engineering and Industrial Technologies, University of Trento

3. Georgia Institute of Technology

Abstract

Patterns calculated by applying the Debye function to faulted spherical nanoparticles are used to test the accuracy of modern Line Profile Analysis theory of faulting for small crystallites. The relative deviation of the determined fault density is found to be dependent on the fault position, and on the particle size. The study of the average pattern from systems of 100 particles (D = 9.8nm) shows an overestimated deviation of the determined fault density by as much as 30%.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A total scattering Debye function analysis study of faulted Pt nanocrystals embedded in a porous matrix;Acta Crystallographica Section A Foundations and Advances;2016-10-31

2. Deformation-induced grain growth and twinning in nanocrystalline palladium thin films;Beilstein Journal of Nanotechnology;2013-09-24

3. A Bayesian approach for denoising one-dimensional data;Journal of Applied Crystallography;2012-05-16

4. On the modelling of the powder pattern from a nanocrystalline material;Zeitschrift für Kristallographie;2011-09-30

5. Faulting in finite face-centered-cubic crystallites;Acta Crystallographica Section A Foundations of Crystallography;2011-04-12

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