Electrical Properties and Characterization of In2O3(ZnO)m Thin Films-Reference-Cited by-同舟云学术

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Electrical Properties and Characterization of In₂O₃(ZnO)_m Thin Films

Published:2001-07 Issue: Volume:214-215 Page:199-202
ISSN:1662-9795
Container-title:Key Engineering Materials
language:
Short-container-title:KEM

Author:

Ogino Tsuyoshi¹,Komatsu Mamabu²,Ohashi Naoki³^ORCID,Sakaguchi Isao⁴,Hishita Shunichi²,Takenaka Tadashi⁵,Haneda Hajime⁶

Affiliation:

1. Kyushu University

2. National Institute for Research in Inorganic Materials

3. National Institute for Materials Science (NIMS)

4. National Institute of Technology and Quality

5. Tokyo University of Science

6. National Institute for Materials Science

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://www.scientific.net/KEM.214-215.199.pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bulk, interface and surface properties of zinc oxide;Journal of the Ceramic Society of Japan;2014

2. Structure and Electric Properties in Tin-Doped Zinc Oxide Films Synthesized by Pulsed Laser Deposition;Journal of The Electrochemical Society;2009

3. Effect of ion irradiation on the evolution of Pt film morphology;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-05

4. Sn film deposition on silica glass substrates;Thin Solid Films;2004-10

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