A Stress Criterion for the β-Sn Transformation in Silicon under Indentation and Uniaxial Compression
Author:
Affiliation:
1. University of New South Wales
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
https://www.scientific.net/KEM.233-236.603.pdf
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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2. In situ observation of the spatial distribution of crystalline phases during pressure-induced transformations of indented silicon thin films;Journal of Materials Research;2014-11-11
3. Raman Spectroscopy-Enhanced IIT: In Situ Analysis of Mechanically Stressed Polycrystalline Si Thin Films;Experimental and Applied Mechanics, Volume 6;2014-07-08
4. Effect of residual stresses on the stability of bct-5 silicon;Computational Materials Science;2014-01
5. In situobservation of the indentation-induced phase transformation of silicon thin films;Physical Review B;2012-03-05
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