Affiliation:
1. National Institute for Materials Science
2. Tohoku University
Abstract
A multi-purpose pattern-fitting system, RIETAN-2000, has been extensively utilized to
contribute to many structural studies. It offers a sophisticated structure-refinement technique of
whole-pattern fitting based on the maximum-entropy method (MEM) in combination with a MEM
analysis program PRIMA. We have recently completed a successor system, RIETAN-FP, to
RIETAN-2000, adding new features such as standardization of crystal-structure data, an extended
March-Dollase preferred-orientation function, and automation of imposing restraints on bond
lengths and angles. Further, we have been developing a new three-dimensional visualization system,
VESTA, using wxWidgets as a C++ application framework. VESTA excels in visualization, rendering,
and manipulation of crystal structures and electron/nuclear densities determined by X-ray/
neutron diffraction and electronic-structure calculations. VESTA also enables us to display wave
functions and electrostatic potentials calculated with part of these programs.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
Cited by
2592 articles.
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