Affiliation:
1. AGH University of Science and Technology
Abstract
Extrinsic resonance effects observed in a low-frequency subresonant mechanical spectrometer are reported. High resolution of the mechanical spectrometer enables precise measurement of small values of the mechanical loss tangent ( tanϕ = 1- 2 × 10-4) and the apparent high values of the loss tangent detected for extrinsic resonance effects in the vicinity of the eigen frequencies of the spectrometer. Forced oscillations can be used as a ‘signal quality test’ to validate the quality of exponentially damped harmonic oscillations in the resonant mode.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
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