1. G. Zoth and W. Bergholz, J. Appl. Phys. Vol. 67, (1990) p.6764.
2. H. Väinölä, M. Yli-Koski, A. Haarahiltunen, and J. Sinkkonen, J. Electrochem. Soc. Vol. 150 (2003), p. G790.
3. D. Macdonald, Appl. Phys. A Vol. 81 (2005), p.1619.
4. S. Naito, T. Nakashizu, Mater. Res. Symp. Proc. Vol. 262 (1992), p.641.
5. M. Miyazaki, Recombination Lifetime Measurements in Silicon, ASTM STP 1340, ed. by D.C. Gupta, F.R. Bacher, W.M. Hughes (American Society for testing and Materials, West Conshohocken, 1998), p.294.