A Novel Markov Model and its Application to BIT System

Author:

Zheng Wen Rong1,Wang Shu Zong2

Affiliation:

1. Naval Univ. of Engineering

2. Naval University of Engineering

Abstract

Intermittent fault is the main factor for the raise of false alarm during the process of the detection in built-in test (BIT). Two-state Markov model and three-state Markov model for test is built for system fault diagnosis with BIT. According to the application of BIT in some complex system, a comparison of the false alarm rate between two-state Markov model and three-state Markov model is present, which shows we can reduce the false alarm rate (FAR) and improve fault detection rate by using three-state Markov model in BIT.

Publisher

Trans Tech Publications, Ltd.

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