Abstract
Measurement results of spectral reflectance spatial distribution on multi-crystalline silicon solar cells surface are presented. The optical measurement apparatus employs a specific designed micro-spectral reflectance meter. It is suitable for working in visible wavelength range; measurable sample size can be as small as 0.06mm. Results of reflectance distribution on mc-Si solar cell are presented as a spatial sampling interval of 0.1 mm. The peak values of spectral reflectance appear about 400nm wavelength and vary from 10% to 30% with the spatial position on solar cell.
Publisher
Trans Tech Publications, Ltd.
Cited by
1 articles.
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