Affiliation:
1. National United University
Abstract
The electrostatic discharge (ESD) failure of power drain-extended MOS (DEMOS) devices, the protection circuit SCR, and a DEMOS with SCR protection circuit will be investigated in this paper. The ESD immunity of the DEMOS was very poor under the human-body model (HBM) testing. Here we discuss how to design an ESD good SCR device. Eventually, the ESD immunity of DEMOS test sample with an SCR circuit can significantly improve device ESD performance.
Publisher
Trans Tech Publications, Ltd.
Reference5 articles.
1. A.J. Walker, H. Puchner, S.P. Dhanraj: IEEE Transactions on Electron Devices, Vol. 56 (2009), p.1753.
2. Wen-Yi Chen, Ming-Dou Ker: IEEE Transactions on Circuits and Systems, Vol. 57 (2010), p.1039.
3. Ming-Dou Ker, Che-Lun Hsu, Wen-Yi Chen: IEEE International Symposium on Circuits and Systems (2010), p.989.
4. Y. Moghe, T. Lehmann, T. Piessens: IEEE Transactions on Solid-State Circuits, Vol. 46 (2011), p.485.
5. MIL-STD-883F, Method 3015. 7, (1996).