Features of Magnetic Properties and FMR of CoFeZr/Si Layered Nanosystems due to their Inner Structure

Abstract

Static magnetic properties, ferromagnetic resonance (FMR) and glancing angle X-ray diffraction spectra (GAXRD) of CoFeZr (tm)/Si (tSi) in multilayer nanosystems were investigated for two groups of the samples characterized by tm = 2 3 nm, tSi = 0.5 5 nm and by tm = 7 12 nm, tSi = 5 13 nm. A computer simulation of GAXRD spectra of multilayer interference structures has been performed taking into account the possibility of silicides formation at metal-Si interfaces. Matter of discussion is the layer and interlayer thickness below which a resonance response corresponds to that of an effective medium rather than of an individual magnetic layer.