Influence of the Waveform and DC Offset on the Asymmetric Hysteresis Loop in Au/PZT/Pt/Al2O3/SiO2/Si Thin Films Prepared by MOCVD Method

Abstract

In this paper, the hysteresis loop of Au/PZT/Pt/Al2O3/SiO2/Si thin films was experimentally measured in different conditions as a waveform and a DC offset, using a precision LC Radiant technology RT-66. The measurements were taken by applying a drive to the Pt bottom electrode connected to the drive of the precision LC and the Au top electrode was connected to the drive of the precision LC. The waveform was applied as wave type = sine; peak voltage = 6 V; frequency = 1 KHz and duration = 100 s. The results show that, by applying waveform and DC offset the hysteresis loop softly changes the polarization (Pr) and coercive field (Vc).