Affiliation:
1. University of Electronic Science and Technology of China
Abstract
Random vibration is one of the main factors influencing the reliability of electrical connectors. In this paper, a Micro-USB electrical connector was chosen to be an object for this research. The finite element method was applied in random vibration analysis. At first, a three-dimensional model of the electrical connector was established by using Pro/E and ANSYS Workbench software. Then, the modal characteristics analysis was carried out and its modal parameters can be obtained from this analysis and the reliability of the electrical connector under the natural frequency can be also verified. Finally, according to results of the simulation, the equivalent stress and deformation response under 1 sigma levels hadn't changed much. The conclusions can provide a reference for the reliability analysis of electronic components.
Publisher
Trans Tech Publications, Ltd.