Comparative Characterisation of CNS/Epoxy and BN/Epoxy Nanodielectrics Using Electrical Tree PD Measurements and Atomic Force Microscopy

Abstract

This paper contributes to the body of knowledge on the efforts to develop nanodielectrics as the next generation of insulation material. The time-to-failure under electrical tree-induced degradation of 1.09-1.35 vol.% hexagonal BN/Epoxy was found to be 3 times longer than in clean epoxy. For 0.31-0.33 vol.% CNS/Epoxy the time-to-failure was 24 times longer than the clean epoxy. The electrical treeing partial discharge behaviour in the BN/Epoxy and CNS/Epoxy showed distinct time-evolution characteristics different from those in the clean epoxy. The improved electrical tree endurance in BN/Epoxy relative to the clean epoxy can be attributed to increased mechanical stiffness. The superiority of the CNS/Epoxy as a nanodielectric is notable. The effect is suggested to be due to the electron affinity properties of the carbon nanospheres at appropriate dispersion levels.