Employing Ceramic Products to Design an Electrostatic Discharge Protection for High-Speed Signal Lines

Author:

Wang Jing Min1,Lin Chun Ting2

Affiliation:

1. St. John's University

2. Cipherlab Co. Ltd

Abstract

With the advance of microelectronics technologies and integrated circuits (ICs) processes, the electrostatic discharge (ESD) has become one of the most important reliability issues in IC products. But treating the ESD-related problems is a real challenge. The paper focuses on the influence of the using of Universal Serial Bus (USB) in plugging and/or unplugging impact arisen from ESD and also proposes an ESD protection design to improve the ESD robustness. This work utilizes off-chip protection along with the commercial ceramic products to achieve effective ESD protection. The impact of the ESD stress applied at the connector pins of USB is evaluated. The protection design for the high-speed signal lines is easily to implement and achieves the following attractive features: (1) Power trace protection, (2) Signals traces protection, (3) GND protection, and (4) Shield protection. Numerous tests have been made to demonstrate the effectiveness of the work.

Publisher

Trans Tech Publications, Ltd.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3