The Method for Estimating the Time to Failure in Accelerated Life Test

Abstract

Accelerated life test was an important means to obtain storage reliability index of missile-borne photoelectric system. Because of difficulty to continuously test, the number of failure samples in the test range could be only got. Whether distribution intervals, logarithmic distribution or new failure time estimation method proposed in this paper such as range median distribution and the uniform distribution of the index had their applicable limitations. On the basis of comparison to Monte Carlo numerical simulation method, the characteristics of the applicability of the estimation method based on Weibull distribution were explored.