Single Event Effects Testing of Xilinx Zynq-7010 SoC with 239Pu Alpha Irradiation

Abstract

Estimating the radiation sensitivity and radiation response of individual electronic units embedded in System on chip (SoC) is important for SoC error rate predicting and fault tolerant system designing. In this paper, the experimental techniques for detecting the single event effects (SEE) of SoC were introduced. The test system has been established and the irradiation experiments have been performed for testing SEE of Xilinx Zynq-7010 SoC with 239Pu alpha radiation source. Several single events functional Interrupt (SEFI) of some typical registers within the SoC sample were detected after receiving the total fluence of 6.101. In the end, the mechanisms of SEFI induced by alpha irradiation on SoC were discussed and analyzed.