A TDC Based BIST Scheme for Operational Amplifier-Reference-Cited by-同舟云学术

A TDC Based BIST Scheme for Operational Amplifier

Published:2014-09 Issue: Volume:644-650 Page:3583-3587
ISSN:1662-7482
Container-title:Applied Mechanics and Materials
language:
Short-container-title:AMM

Author:

Yuan Jun¹,Wang Wei¹

Affiliation:

1. Chongqing University of Posts and Telecommunications

Abstract

This paper presents a time-to-digital converter (TDC) based built-in self-test (BIST) scheme for operational amplifier (Op Amp). The propagation delay exiting in the transient response of the Op Amp is monitored by the inverter based TDC, and converted into a digital code based on the referenced delay interval of the inverter used in the TDC, as a result, the digital code is finally employed to determine the test rsults. The circuit-level simualtion results of the proposed BIST syetem for a two-stage Op Amp are presented to demonstrated the feasility of the proposed BIST scheme with high fault coverage.

Publisher

Trans Tech Publications, Ltd.

Link

https://www.scientific.net/AMM.644-650.3583.pdf

Reference8 articles.

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3. J. Font-Tossello, etc., A Digital BIST for Opamps Embedded in Mixed-Signal Circuits by Analysing the Transient Response', IEEE Int. Caracas Conf. On Devices, Circuits and Systems, Aruba, pp.1012-5, (2002).

4. J. Yuan and M. Tachibana, A BIST Scheme for Operational Amplifier by Checking the Stable Output of Transient Response, ，20th European Conference on Circuit Theory and Design, Linkoping, Sweden, Aug. 29-31, (2011).

5. J. Yuan and M. Tachibana, A Two-Step BIST Scheme for Operational Amplifier, Proceedings of Workshop on Synthesis and System Integration of Mixed Information technologies (SASIMI-2012), Beppu, Japan, Mar. (2012).

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