A Technology to Multi-Resolution Surface Reconstruction-Reference-Cited by-同舟云学术

A Technology to Multi-Resolution Surface Reconstruction

Published:2013-09 Issue: Volume:805-806 Page:1933-1936
ISSN:1662-8985
Container-title:Advanced Materials Research
language:
Short-container-title:AMR

Author:

Zhu Tong Tong¹,Xu Gang¹,Ma Ming Cong¹,Liu Xing Ye¹

Affiliation:

1. Air Force Logistics College

Abstract

An approach is presented based on scattered data points subdivision surfaces to achieve multi-resolution surface reconstruction techniques. In the surface reconstruction process, based on gray-scale image edge detection ideological eigenvalues scattered data analysis, these features will generate texture characteristic curve values tessellation, thus forming a multi-resolution mesh model structure; After testing, the technology is not only surface reconstruction short time, while the constructed subdivision surfaces can reflect the characteristics of the original details of the data.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Link

https://www.scientific.net/AMR.805-806.1933.pdf

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