Prediction of Nanostructured ZnO Thin Film Properties Based on Neural Network

Abstract

An approach in the prediction of zinc oxide (ZnO) thin films properties based on neural network is presented in this paper. The research had been focused on the electrical properties of ZnO. The sputtering power, substrate temperature, deposition time and oxygen ratio were selected as the input variables while the resistivity and conductivity were selected as the output. The numerical results obtained through the neural network model were compared with the experimental results. The result obtained from the system model of the proposed procedure was reasonably good and promising. Therefore, the prediction based on neural network model is a reliable approach compared to the traditional method of trial-and-error process.