Ultrafast Electrical Signal Electro-Optic Sampling Test Theory and Test System-Reference-Cited by-同舟云学术

Ultrafast Electrical Signal Electro-Optic Sampling Test Theory and Test System

Published:2012-09 Issue: Volume:571 Page:471-475
ISSN:1662-8985
Container-title:Advanced Materials Research
language:
Short-container-title:AMR

Author:

Li Jian Wei¹,Xu Nan¹,Li Jian¹,Zhang Zhi Xin¹

Affiliation:

1. National Institute of Metrology

Abstract

Discussed the principle of electro-optic sampling technique and implementation methods of Ultra-fast electrical signals, the electric field of electro-optical crystal and sampling pulses as well as the interaction between the principle of time scanning unit, established the coplanar waveguide parameters model, and analyzed the technical indicators of test system.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Link

https://www.scientific.net/AMR.571.471.pdf

Reference9 articles.

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2. Bieler M, Spitzer M, Hein G. Ultrafast optics establishes metrological standards in high-frequency electronics . Appl. Phys. (A), 2004, 78(4): 429~433.

3. Seitz S, Bieler M, Hein G, et al. Correction of picosecond voltage pulses measured with external electro-optic sampling tips. IOP Meas. Sci. Technol, 2007, 18: 1353~1360.

4. Williams D F, Hale P D, Clement T S, et al. Calibrated 200-GHz waveform measuremen. IEEE Trans on MTT, 2005, 53(4): 1384~1389.

5. Williams D F, Hale P D, Clement T S. Mismatch correction for electro-optic sampling system. Proc 56th ARFTG Conference Digest. 2000, 38: 1~5.

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