Study of Edge Detection of Printed Circuit Board Photoelectric Image Based on Multi-Scale Wavelet Transform-Reference-Cited by-同舟云学术

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Study of Edge Detection of Printed Circuit Board Photoelectric Image Based on Multi-Scale Wavelet Transform

Published:2012-06 Issue: Volume:542-543 Page:850-853
ISSN:1662-8985
Container-title:Advanced Materials Research
language:
Short-container-title:AMR

Author:

Qiao Nao Sheng¹,Tang Jing²

Affiliation:

1. Hunan university of Arts and Science

2. Changde Vocational Technical College

Abstract

Aiming at the dark printed circuit board photoelectric image that contains noise acquired by CCD system, the edge detection method by using multi-scale wavelet transform is proposed. Firstly, its basic principle is analyzed in detail, and the simple physics explanation and formula deduction are given. Secondly, the idiographic detection steps are given. Finally, the results of experiment verify the correctness of theory analysis.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Link

https://www.scientific.net/AMR.542-543.850.pdf

Reference7 articles.

1. Qiao Nao-Sheng, Ye Yu-Tang and Huang Yong-Lin: Chinese Physics B Vol 20 (2011), p.014203/1.

2. Naosheng Qiao, Yutang Ye, Yonglin Huang, Lin Liu and Yulin Wang: SPIE Vol 7283 (2009), p. 72832Y/1.

3. Qiao Nao-sheng, Ye Yu-tang, Liu lin, Huang Yong-lin, Yang Xian-ming and Wang Yu-lin: Journal of Optoelectronics Laser Vol 21 (2010), p.1885, In Chinese.

4. Lin Song, Zhu Yangong, Zhou Dawei, Xu Dianguo and Wang Yan: Jourmal of Harbin Institute of Technology Vol 31 (1999), p.34, In Chinese.

5. Liu Xue-feng and Wang Shi-tong: Computer Engineering Vol 35 (2009), p.226, In Chinese.

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