Influence of the Source Temperature on Properties of CdTe Thin Films by Close-Spaced Sublimation-Reference-Cited by-同舟云学术

Influence of the Source Temperature on Properties of CdTe Thin Films by Close-Spaced Sublimation

Published:2012-11 Issue: Volume:590 Page:40-44
ISSN:1662-8985
Container-title:Advanced Materials Research
language:
Short-container-title:AMR

Author:

Shen Xin Jie¹,Shi Cheng Wu¹,Zhan Xiao Ping¹,Yao Min¹,Zhang Yan Ru¹

Affiliation:

1. Hefei University of Technology

Abstract

In this paper，CdTe thin films were successfully grown at higher source temperatures of 650 °C and 700 °C using close-spaced sublimation(CSS) and characterized by energy dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD), scanning electron microscope (SEM), UV-Vis-NIR absorption spectra, respectively. The results indicated that the grain size of CdTe thin film increased from 1 μm to 5 μm with the increase of the source temperature from 650 °C to 700 °C. The direct band gaps of CdTe thin films prepared at different source temperatures of 650 °C and 700 °C were 1.44 and 1.43 eV, respectively.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Link

https://www.scientific.net/AMR.590.40.pdf

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