Critical X-Ray Scattering in Mixed Piezoelectric Material PbZr0.6Ti0.4O3-Reference-Cited by-同舟云学术

Critical X-Ray Scattering in Mixed Piezoelectric Material PbZr₀_.6Ti_0.4O₃

Published:2015-10 Issue: Volume:245 Page:211-216
ISSN:1662-9779
Container-title:Solid State Phenomena
language:
Short-container-title:SSP

Author:

Andronikova Daria¹,Bronwald Yurii¹,Burkovsky Roman²,Chernyshev Dmitry¹,Filimonov Alexey¹,Nacke Bernard³,Ye Zuo Guang⁴,Vakhrushev Sergey¹

Affiliation:

1. Peter the Great St. Petersburg State Polytechnical University

2. A.F. Ioffe Physico-Technical Institute

3. Gottfried Wilhelm Leibniz Universität Hannover

4. Simon Fraser University

Abstract

The results of the experimental study of the critical X-ray scattering (CS) in PbZr0.6Ti0.4O3 (PZT40) single-crystal are presented. Temperature evolution of the CS lineshape and intensity was analyzed. It is demonstrated that CS can be described in terms of the mean-field model. Temperature dependences of the peak intensity of the CS, proportional to the static susceptibility, and the correlation length of the «ferroelectric fluctuations» follow the Curie-Weiss law with the Curie temperature Tc=638 K. Obtained results confirm the second-order character of the phase transition in the PZT40.

Publisher

Trans Tech Publications, Ltd.

Subject

Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics

Link

https://www.scientific.net/SSP.245.211.pdf

Reference23 articles.

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