Affiliation:
1. Universiti Sains Malaysia
Abstract
In this study, Zinc Oxide (ZnO) microstructures were grown on porous silicon (PS) using chemical bath deposition (CBD) method by varying the growth time. The field emission scanning electron microscopy (FESEM) revealed the morphology and sized of ZnO. The X-ray diffraction (XRD) spectra indicate the high quality growth of ZnO on PS surface. Raman analyses revealed the peaks shift of E2(High), characterized wurtzite lattice and indicates good crystallinity of ZnO.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
Cited by
6 articles.
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