Affiliation:
1. National University of Science and Technology
2. Russian Academy of Sciences (RAS)
3. Tohoku University
Abstract
We report on structural and transport properties of Ni-Mn-In thin films. The results obtained have indicated that transport properties of the thin films strongly depend on the structural ordering of the films. Specifically, annealing converts the semiconducting-like character of the resistivity into that typical for metals. This is due to annealing-induced crystallization of as-deposited films which are in partially amorphous state. In both the as-deposited and the annealed thin films the field dependence of the resistivity is negative, which is typical for thin films of Heusler alloys and can be ascribed to the suppression of the spin disorder scattering.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
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