Structural and Dielectric Properties of Calcium Bismuth Titanate (CaBi4Ti4O15) Ceramics
Author:
Affiliation:
1. Anil Neerukonda Institute of Technology and Sciences (Autonomous)
2. SBSYM Degree College
3. GITAM (Deemed to be University)
4. Sri Krishnadevaraya University
Abstract
Publisher
Trans Tech Publications Ltd
Link
https://www.scientific.net/AST.106.54.pdf
Reference18 articles.
1. O. Auciello, A critical comparative review of PZT and SBT-based science and technology for non-volatile ferroelectric memories, Integr. Ferroelectric 15 (1997) 211-220.
2. Takashi Hase, Takehiro Noguchi, Yoichi Miyasaka, Analysis of the degradation of PZT and SrBi2Ta2O9 thin films with reductive process, Integr. Ferroelectric 16 (1997) 29-40.
3. S.K. Kim, M. Miyayama, H. Yanagida, Electrical anisotropy of BaBi4Ti4O15 single crystal. J Ceram. Soc. Jpn 102 (1994) 722-726.
4. S.K. Kim, M. Miyayama, H. Yanagida, Complex impedance and modulus analysis on electrical anisotropy of layer- structured BaBi4Ti4O15 single crystal in paraelectric phase, J. Ceram. Soc. 103 (1995) 315-318.
5. Yong-il Park, Miyayama, T. Kudo, Fabrication of PbBi4Ti4O15 and Pb2Bi4Ti5O18 thin films by sol-gel method, J. Ceram. Soc. Jpn. 107 (1999) 413-418.
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