Residual Stresses Assessment in Coated Materials: Complementarity between Neutron and X-Ray Techniques

Author:

Rogante M.1ORCID,Mikula Pavol2,Vrána Miroslav3

Affiliation:

1. Rogante Engineering Office

2. AS CR and Research Centre Řež, Ltd.

3. Academy of Sciences of the Czech Republik

Abstract

The residual stress (RS) status induced in the substrate of coated materials by the coating process plays frequently a major role in lending the component’s characteristics. RS assessment can give, thus, a substantial contribution in justifying different cases of failure or else bad performance of coated components due to e.g. the coating delamination or to other occurrences which are not simply interpretable via the conventional mechanical tests or microstructure analyses. The adoption of both neutron diffraction (ND) and X-ray diffraction (XRD) techniques has revealed its usefulness in assessing the RS values in proximity of the coating interface area, respectively, without any layer removal or hole drilling at the extreme surface. In this paper, some real cases of RS determination in coated materials by using these techniques and exploiting their complementarity are described. ND, in particular, is very suitable for crucial applications, where a much different stress situation than that assessed by XRD could be present at some depth below the surface. The results achieved can yield trends adoptable in monitoring of the coating features.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference26 articles.

1. M. Rogante, P. Mikula and M. Vrána, Surf. Coat. Techn., 204 (2009), p.650.

2. A. Scrivani, S. Ianelli, A. Rossi, R. Groppetti, F. Casadei and G. Rizzi, Wear 250 (2001), p.107.

3. A.A. Samad, E. Lugscheider, K. Bobzin and M. Maes, in: Proc. Int. Thermal Spray Conf. 2004, Protective Coatings against Wear and Erosion I, DVS-Verlag GmbH, Düsseldorf (2004), p.1.

4. K. Tani and A. Nakahira, in: Proc. Int. Thermal Spray Conf. 2004, Applications V, DVS-Verlag GmbH, Düsseldorf (2004), p.18.

5. R. Winkler, F. Bültmann, S. Hartmann and H. Burkard, in: Proc. Int. Thermal Spray Conf. 2003, edited by C. Moreau and B. Marple, ASM International, USA (2003).

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3