Texture Development of Ni3Al Thin Foils during Recrystallization and Grain Growth

Abstract

The texture evolution of 83% cold-rolled Ni3Al foils during recrystallization was examined through heat treatments at 600 °C, 800 °C, and 1000 °C for 30 min. X-ray texture measurements revealed that the texture changed from the as-rolled Goss to a transitional complicated one by primary recrystallization and eventually returned to the Goss texture during grain growth. The SEM-EBSD analysis revealed that the return to the Goss texture was accompanied by the decrease of random boundaries (RBs) and the increase of S1 boundaries. The preferential growth of the Goss-oriented grains was explained by the difference in the grain boundary energy between the RBs and S1, based on the observed grain-orientation maps.