Surface Morphology and Optical Property of Silver Nanoparticle Thin Film Prepared by Electrostatic Spray Deposition
-
Published:2010-01
Issue:
Volume:93-94
Page:149-152
-
ISSN:1662-8985
-
Container-title:Advanced Materials Research
-
language:
-
Short-container-title:AMR
Author:
Boonnuk Y.1, Chanhom A.1, Tunhoo B.2, Thiwawong T.2, Nukeaw J.2
Affiliation:
1. CHE 2. King Mongkut’s Institute of Technology Ladkrabang
Abstract
Silver nanoparticle thin films were deposited on glass substrates by electrostatics spray
deposition. Electrostatic spray condition was optimized by varying distance between nozzle and
substrate between 20 mm and 60 mm, deposition time was fixed at 5 minute. The surface
morphology and optical properties of films were carried out by using Atomic Force Microscope
(AFM), Field Emission Scanning Electron Microscopy (FE-SEM) and UV-Vis Spectrophotometer.
The results is indicate that the surface morphology of silver nanoparticle thin film show the grain
size of film near around 100 nm at distance between nozzle and substrate of 60 mm and the RMS
roughness decreases from 9.59 nm to 2.35 nm when distance between nozzle and substrate was
increased from 20 mm to 60 mm. The optical absorption spectra showed the main absorption peak
at 436 nm. When the distance between the nozzle and the substrate raise, decrease in absorption has
been observed.
Publisher
Trans Tech Publications, Ltd.
Subject
General Engineering
Reference12 articles.
1. M.L. Scott, P.N. Arendt, R.W. Springer, R.C. Cordi, W.J. McCreary, in: H.E. Bennett, A.H. Guenther, D. Milam, B.E. Newman (Eds. ): Damage in Laser Materials, Nat. Bur. Stand. (US) Spec. Publ., Boulder, Colorado, Vol. 746 (1987), p.419. 2. N. Thomas, A. Erlandson, J. Farmer, H. Gregg, C. Marshall, W. Siekhaus, J. Wolfe, D. Fix, D. Ahre, in: H.E. Bennett, A.H. Guenther, M.R. Kozlowski, B.E. Newnam, M.J. Soileau (Eds. ): Laser-Induced Damage in Optical Materials, Proceeding of SPIE, Boulder, Colorado, Vol. 3578, (1999). 3. Yuqing Xiong, Hao Wu, Yan Guo, Yan Sun, Dequan Yang, Daoan Da: Thin Solid Films Vol. 375 (2000), pp.300-303. 4. A. Subrahmanyam, Ullash Kumar Barik: Physics and Chemistry of Solids Vol. 66 (2005), pp.817-822. 5. Feng-Jin Li, Byeong-Gyu Roh, Hyun-Taek Lim, Ji-Soo Kim, Jae-Yong Park, Hong-Woo Yu, Seung-Chul Park, Yoon-Heung Tak, Byung-Chul Ahn: Thin Solid Films Vol. 517 (2009), pp.2941-2944.
|
|