Fabrication and Structure Measurement of the Double-Barrier Nano Film Resonant Tunneling Gyroscope

Author:

Du Kang1,Wang Rui Rong1,Li Meng Wei1,Shi Yun Bo1,Liu Jun1

Affiliation:

1. North University of China

Abstract

In this paper, a gyroscope with novel structure is designed and fabricated by the GaAs surface micromaching technology and GaAs bulk micromachining processes technology to achieve an integration of RTD and gyroscope structure. The structure and properties of RTD are tested by Transmission electron microscopy and Aglient 4156C semiconductor analyzer, and then the key parameters of gyroscope are measured by application of Scanning Electron Microscope. The effect of packaged gyroscope is tested by Polytec Micro-system analyzer. The problems in the fabrication process are analyzed and summarized, which have certain reference significance for the further study.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference12 articles.

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