The Model of Nano-Scale Cu-Particle Removal in CO2-Based Micelle Solutions with Different Surfactants

Author:

Wang Yun Run1

Affiliation:

1. Renmin University of China

Abstract

This work focused on the analysis of static forces of a Cu particle in CO2-based micelle solutions with different surfactant, including fluorinated surfactants PFPE COO-NH4+, 8FS(EO)2and hydrocarbon surfactants L31, DiF8-PO4-Na+. Calculations demonstrated that high pressure could impose enough capillary pressure effect beneath a particle to compete with the net adhesion force and increase the particle surface separation distance. The ESD for the micelle solutions had the similar behavior, otherwise, the value of NAF for the micelle solution with surfactant DiF8-PO4-Na+ had the minimum relative to other surfactant micelle solutions, suggesting that Cu particles would be more easily removed in micelle solution with DiF8-PO4-Na+ surfactant.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. The Use of Surfactants in Enhanced Particle Removal During Cleaning;Surfactants in Precision Cleaning;2022

2. The Use of Surfactants to Enhance Particle Removal from Surfaces;Developments in Surface Contamination and Cleaning;2016

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