Full-Profile Approximation of the X-Ray Diffractogram for Nanographite Powder Including γ-Band by Taking into Account Radial Dependence of Interatomic Distances

Abstract

This paper outlines the procedure for determining the sizes, structural parameters and percentage content of various particle types in nanographite powders by full-profile approximation of the X-ray diffractogram of sample with using a set of X-ray diffraction profiles for powders of model nanographites. It was shown that taking into account the model nanographites with the radial dependence of interatomic distances within the layer and the dependence of interlayer distances on average number of atoms in the layer allows to describe the X-ray diffraction profile of nanographite powder in the wide angular range including so-called γ-band in small angles without assumptions on presence of other structures in it.