Study on 775 Nanovolt Noise Measurement Method for a Low Noise Voltage Reference

Abstract

Frequently, voltage reference stability and noise define measurement limits in instrumentation systems. In particular, reference noise often sets stable resolution limits. Reference voltages have decreased with the continuing drop in system power supply voltages, making reference noise increasingly important. The compressed signal processing range mandates a commensurate reduction in reference noise to maintain resolution. Noise ultimately translates into quantization uncertainty in A to D converters, introducing jitter in applications such as scales, inertial navigation systems, infrared thermography, DVMs and medical imaging apparatus.