Affiliation:
1. National University of Defense Technology
Abstract
Antifuse FPGA because for its low power consumption, high reliability, high security, etc., are widely used in space electronic systems. However, antifuse FPGA running in the space environment is also vulnerable to space radiation. This paper analyzes the single event effects in antifuse FPGA in detail and put forward the TMR and EDAC anti-SEE hardening design and implementation methods. The ground heavy ions accelerated test is conducted to verify the design of hardening; test results and analysis show that the hardening design method can effectively improve the COTS antifuse FPGA for space applications reliability.
Publisher
Trans Tech Publications, Ltd.
Reference6 articles.
1. J. J. Wang, Radiation effects in FPGAs, The 9th Workshop on Electronics for LHC Experiments, Amsterdam, Netherlands, Oct. 2003, pp.34-43.
2. R. Katz, K. LaBel, J. J. Wang, B. Cronquist, R. Koga,S. Penzin, and G. Swift, Radiation Effects on Current Field Programmable Technologies, IEEE Transactions on Nuclear Science. NS-44, 1945, (1997).
3. J. J. Wang, W. Wong, S, Wolday, et al. Single event upset and hardening in 0. 15 um antifuse-based field programmable gate array. , IEEE Transactions on Nuclear Science, 2003, 50(6), pp.2158-2166.
4. K. F. Xing, J. Yang, Y. K. Wang, et al. Study on anti-radiation technique for Xilinx SRAM-based FPGA, Journal of Astronautics, 2007, 28(1): 123-129.
5. J. S. George, R. Koga, M. Zakrzewski, Single event effects tests on the Actel RTAX2000S FPGA, IEEE Radiation Effects Data Workshop, July, 20, 2009, pp.140-147.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献