Study on Signal Integrity Simulation for High Speed Serial Rapid IO-Reference-Cited by-同舟云学术

Study on Signal Integrity Simulation for High Speed Serial Rapid IO

Published:2013-07 Issue: Volume:340 Page:881-886
ISSN:1662-7482
Container-title:Applied Mechanics and Materials
language:
Short-container-title:AMM

Author:

Jiang Hong Xu¹,Zhang Xiao Hong¹,Zhao Wei¹,Lu Jin Yuan²

Affiliation:

1. Beihang University

2. China United Network Communications Corporation

Abstract

With the increases of signal transmission rate in digital systems, the signal integrity becomes increasingly important in high-speed circuit design. During the hardware design of high-speed serial Rapid IO, signal integrity simulation of 5Gbps high-speed serial bus had been carried out by using Channel Analysis tools. Reliable data was formed by effectively analysis and evaluation of pre-simulation, the signal quality of high-speed serial Rapid IO was verified by post-simulation. The non-ideal design parameters were optimized by referring to the effective data obtained in pre-simulation. Signal quality has been greatly improved by parameters optimization. Signal integrity simulation analysis and verification of serial Rapid IO provides strong support for the design and significantly improves the efficiency of hardware design.

Publisher

Trans Tech Publications, Ltd.

Link

https://www.scientific.net/AMM.340.881.pdf

Reference6 articles.

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