Affiliation:
1. Fraunhofer Institute for Production Systems and Design Technology (IPK)
Abstract
The aim of this paper is to present the design of a condition monitoring tool, its use for the intelligent configuration of pattern recognition algorithms, for fault detection, and for diagnosis applications. The modular design and functionality of the tool will be introduced. The tool, developed and implemented by Fraunhofer IPK, can be used, in particular, to support the development process of algorithms for condition monitoring of wear-susceptible components in production systems. An example of the industrial application of the tool will be presented. This will include the implementation of configured algorithms using the tool on an embedded system using Raspberry Pi 2 and MEMS sensor. Finally, the evaluation of these algorithms on an axis test rig at different operating parameters will be presented.
Publisher
Trans Tech Publications, Ltd.
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