Affiliation:
1. Kunming University of Science and Technology
2. Beijing Normal University
Abstract
First, Ti6Al4V alloy samples were modified by tantalum ion implantation at a dose of 1.5×1017ions/cm2, and then silver ion at a dose of 1×1017ions/cm2. Glancing angle X-ray diffraction analysis was used to characterize the phase composition of un-implanted Ti6Al4V alloy and Ta+Ag dual-ion-implanted Ti6Al4V alloy samples. X-ray photoelectron spectroscopy analysis was used to investigate the chemical states of the elements on the Ta+Ag dual-ion-implanted Ti6Al4V alloy sample’s surface. The results show that small amounts of Ta and Ag were present in their elementary forms, along with TiO2, Ta2O5, and TaOx.
Publisher
Trans Tech Publications, Ltd.
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