Study of Built-In Electric Field and Migration of Carries in Thermal/Electric-Field Poled Fused Silica

Author:

Dai Zheng Quan1,Duan Jin Yan2,Wang Jian2,Li You2,Ren Yi Tao2

Affiliation:

1. Southwest Forestry University

2. Yunnan University

Abstract

The thermal/electric poling process of fused silica glass is analyzed based on the multi-carriers model. The carrier continuity equation is applied to calculate the variation of the carrier concentration with time. The border of positive charge and negative charge is analogous to a p-n junction. Calculation of the built-in electric field is based on the Poisson equation. The result shows that the second-order nonlinearity effect is mainly formed by the Na+ depletion in the poled fused silica glass. The non-linear coefficient is calculated, it is agree well with the literature values, which verifies the reliability of the theory. The study provided theoretical foundation for manufacture optical communication components.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Reference18 articles.

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