1. M.E. Williams and et al.: Proceedings of the ASPE, Vol. 20 (1999), p.583.
2. P.T. Konkola and D.L. Trumper: JSME Int. Journal Series C, Vol. 46 (2003), No. 2, p.370.
3. M. Ohtsuka and et al.: JSME International Journal Series III, Vol. 33 (1990) No. 1, p.61.
4. W.T. Novak and D. Watson: Proceedings of the ASPE, Vol. 22 (2000), p.517.
5. D. Trust: Semiconductor International, (2002), p.165.