The Influence of Die-Attach Adhesives on the Packaging of MEMS Accelerometer

Abstract

The attachment of the micromechanical silicon die to the substrate is one of the most critical steps in the packaging of highly accurate MEMS (microelectro-mechanical systems) accelerometer. The stress and strains, induced during die-attach process because of TCE (thermal coefficient of expansion) mismatches between different materials, will adversely affect the output characteristics of the accelerometer sensor. In this paper, three different materials: OE138, DG-3S and H70E are selected as the die-attach adhesives of a MEMS comb capacitive accelerometer. The stress and deformation of the silicon die, after the accelerometer model is cured from 80 °C to 20 °C, are evaluated with the aid of finite element analysis (FEA). As the results show, Young’s modulus and the thickness of the adhesives are the most significant factors influencing the stress and deformation of the silicon die. Soft adhesive material (OE138) have better stress absorption, and the stress and deformation of the silicon die decrease with the increasing thickness of the adhesive. Consequently, a soft and thick adhesive is recommended for the die-attach packaging of MEMS accelerometer.