Optical and Structural Characterization of Erbium-Doped Ion-Implanted Tellurite Glasses for Active Integrated Optical Devices

Author:

Berneschi Simone1,Brenci M.1,Nunzi Conti Gualtiero1,Pelli Stefano1,Righini G.C.2,Bettinelli M.3,Speghini A.3,Bányász I.4,Fried M.4,Khanh N.Q.4,Pászti F.5,Watterich A.4,Leto Andrea6,Pezzotti Giuseppe6,Porporati Alessandro Alan6

Affiliation:

1. MDF-Lab, Istituto di Fisica Applicata

2. CNR

3. University of Verona

4. Hungarian Academy of Sciences

5. HAS

6. Kyoto Institute of Technology

Abstract

Erbium-doped tellurite glasses show great potential for the fabrication of high-performance integrated optical amplifiers and lasers, thanks to their unique properties in terms of bandwidth and rare earth solubility. As a first step towards the development of smart multi-functional integrated optical circuits, the fabrication of multimode channel waveguides in a sodium-tungsten-tellurite glass, by using nitrogen ions implantation, has been recently demonstrated [1]. The effects of the ion implantation process, however, have not been fully clarified, and a deeper investigation would be necessary in order to optimize the process and to truly exploit the glass useful characteristics. We therefore report here the results of a broad optical, topographic, and structural characterization of tellurite samples irradiated with various doses of nitrogen ions, while keeping constant the beam energy at 1.5 MeV. Characterization techniques have included absorption and luminescence spectroscopy, modal (dark-line) spectroscopy, surface profilometry, scanning electron microscopy, cathodoluminescence spectroscopy and EDX analysis.

Publisher

Trans Tech Publications Ltd

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