Formation of Ordered Pores Determined by Positronium Time of Flight Spectroscopy
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Published:2008-11
Issue:
Volume:607
Page:201-203
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Author:
Qin Xiu Bo1,
Yu Run Sheng1,
Kurihara Toshikazu2,
Cao Xing Zhong2,
Wang Bao Yi1,
Wei Long1
Affiliation:
1. Chinese Academy of Sciences
2. High Energy Accelerator Research Organization (KEK)
Abstract
We prepared a series of mesoporous silica films to study the structural information of ordered pores by positronium Time of Flight (Ps-TOF) spectroscopy. By changing the ratio of surfactant to silicon source, the pore structure is tuned. Results show that once ordered pores are formed, clear Ps TOF peak is observed. And the film with less distributed pore geometry leads to a narrowed Ps TOF peak.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Cited by
1 articles.
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