VJFET Based All-SiC Normally-Off Cascode Switch for High Temperature Power Handling Applications

Author:

Veliadis Victor1,Hearne Harold1,McNutt Ty2,Snook Megan1,Potyraj Paul1,Scozzie Charles3

Affiliation:

1. Northrop Grumman Electronic Systems

2. APEI Inc.

3. U.S. Army Research Laboratory

Abstract

High-voltage vertical-junction-field-effect-transistors (VJFETs) are typically designed normally-on to ensure low-resistance voltage-control operation at high current-gain. To exploit the high-voltage/temperature capabilities of VJFETs in a normally-off voltage-controlled switch, high-voltage normally-on and low-voltage normally-off VJFETs were connected in the cascode configuration. The cascode gate’s threshold voltage decreases from 2.5 V to 2 V as the temperature increases from 25°C to 225°C, while its breakdown voltage increases from -23 V to -19 V. At 300°C, the drain current of the cascode switch is 21.4% of its 25°C value, which agrees well with the reduction of the 4H-SiC electron mobility with temperature. The VJFET based all-SiC cascode switch is normally-off at 300°C, with its threshold voltage shifting from 1.6 V to 0.9 V as the temperature increases from 25°C to 300°C. This agrees well with the measured reduction in VJFET built-in potential. Finally, the reduction in cascode transconductance with temperature follows that of the theoretical 4H-SiC electron mobility. Overall, the measured thermally-induced cascode parameter shifts are in excellent agreement with theory, which signifies fabrication of robust SiC VJFETs for power switching applications.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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1. SiC Technology;SiC Technology;2024

2. SiC and GaN Power Devices;More-than-Moore Devices and Integration for Semiconductors;2023

3. Silicon Carbide Junction Field-Effect Transistors (SiC JFETs);Wiley Encyclopedia of Electrical and Electronics Engineering;2014-12-15

4. Reliable Operation of SiC Junction-Field-Effect-Transistor Subjected to over 2 Million 600-V Hard Switch Stressing Events;Materials Science Forum;2013-01

5. 1200 V SiC Vertical-Channel-JFETs and Cascode Switches;Silicon Carbide;2011-03-28

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