The Effect of Process Parameters on 4H-SiC Single Crystal Grown by a PVT Method

Author:

Yeo Im Gyu,Lee Tae Woo1,Park Jong Hwi1,Yang Woo Sung1,Ryu Heui Bum1,Park Mi Seon1,Kim Il Soo1,Shin Byoung Chul1,Lee Won Jae1,Eun Tai Hee2,Lee Seung Seok2,Chun Myong Chuel3

Affiliation:

1. Dong-Eui University

2. Research Institute of Industrial Science and Technology

3. POSCO Center

Abstract

Extensive study of various process parameters to influence on the growth of 4H-SiC crystal has been carried out using the transformation of the 6H-SiC seed by a PVT method. The axial temperature gradients were increased throughout increasing the crucible length along growth direction in order to enhance the growth rate and transformed crystal yield. The N2/Ar gas ratio used during the crystal growth related with carrier concentration/mobility of grown crystal. In the initial stage of growth, foreign polytypes such as 6H/15R were observed on 6H-SiC seed crystal but 4H crystals were entirely grown after the process optimization. While the typical absorption spectrum of SiC seed crystal indicated that the SiC polytype was the 6H-SiC with fundamental absorption energy of about 3.02eV, absorption spectrum of grown SiC crystal exhibited 4H-SiC with fundamental absorption energy of about 3.26eV. The entirely transformed SiC region exhibited lower micropipe density than 6H/4H transition region.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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