External Reference Samples for Residual Stress Analysis by X-Ray Diffraction

Author:

Lefebvre Fabien1,Francois M.2,Cacot J.3,Hemery C.4,Le-Bec P.5,Baumhauer E.6,Bouscaud Denis7,Bergey T.8,Blaize D.8,Gloaguen D.9,Lebrun Jean Lu10,Cosson A.11,Kubler Regis12,Cheynet Y.13,Daniel E.14,Michaud H.15,Monvoisin J.C.8,Blanchet P.16,Allain P.16,Mrini Y17,Sprauel Jean Michel18,Goudeau Philippe19,Barbarin P.1,Charles C.1,Le Roux J.M.1,Seiler Wilfrid20,Fischer C.12,Desmas L.21,Ouakka A.22,Moya M.J.23,Bordiec Y.24

Affiliation:

1. CETIM

2. University of Technology of Troyes (UTT)

3. Global Research and Development

4. SAS CIPRES

5. EDF R and D

6. PSA Centre technique de Belchamp

7. Arts et Métiers ParisTech

8. SAFRAN

9. Université de Nantes, Ecole Centrale de Nantes

10. Ecole Nationale Supérieure d''Arts et Métiers

11. SKF

12. Arts and Metiers ParisTech

13. SNCF

14. Metal Improvement Company

15. Ascometal CREAS

16. DCNS BU Propulsion Nantes-Indret

17. RENAULT (Dimat)

18. Aix Marseille Universités

19. Université de Poitiers

20. Ecole National Supérieure d'Arts et Metiers

21. MELIAD

22. ALLEVARD REJNA AUTOSUSPENSIONS

23. Centre de Recherche et Transfert de Technologie8 EMM, GEM, C.R.T.T.

24. SONATS

Abstract

The GFAC (French Association for residual stress analysis) decided in 2007 to work on external reference samples for residual stress analysis by X-ray diffraction as defined in the XPA 09-285 and EN 15305-2009 standards. Seven materials are studied: ferritic steel, martensitic steel, aluminium alloy, titanium alloy, 2 types of Nickel-Chromium alloy and tungsten thin layers deposited on silicon wafers. The purpose of this external round robin campaign is threefold: (i) to give possibilities for each laboratory involved in the campaign test to obtain external reference samples for each material tested, (ii) to validate a common procedure for qualification of external samples and (iii) to commercialise validated external reference samples through the GFAC association. A common approach of X-Ray diffraction parameters, samples geometry and standard procedure has been chosen and adopted by each laboratory involved in these tests. No indication in terms of residual stress calculation method is given; the choice of the method (centroid, middle point, maximum of peak, fitting…) is the choice of the laboratory according to their X-ray diffraction set-ups, softwares and experience. Once all samples are analysed, values given by each laboratory are compared and analysed.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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